Currently browsing: Items authored or edited by Thomas Buggey

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Generated on Thu Dec 2 07:43:59 2021 GMT.

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Parsons, Steven; Hall, David; Holland, Andrew; Verhoeve, Peter; Sembay, Steven; Randall, George; Hetherington, Oliver; Yeoman, Dean; Buggey, Thomas and Soman, Matthew (2020). Radiation damage testing status of the CCDs for the SMILE SXI. In: X-Ray, Optical, and Infrared Detectors for Astronomy IX (Holland, Andrew and Beletic, James eds.), SPIE.

Heymes, Julian; Soman, Matthew; Buggey, Thomas; Crews, Chiaki; Randall, George; Gottwald, Alexander; Harris, Andrew; Kelt, Andrew; Kroth, Udo; Moody, Ian; Meng, Xiao; Ogor, Oskar and Holland, Andrew (2020). Calibrating Teledyne-e2v’s ultraviolet image sensor quantum efficiency processes. In: X-Ray, Optical, and Infrared Detectors for Astronomy IX (Holland, Andrew D. and Beletic, James eds.), p. 58.

2018To Top

Soman, M.R.; Hall, D.J.; Holland, A.D.; Burgon, R.; Buggey, T.; Skottfelt, J.; Sembay, S.; Drumm, P.; Thornhill, J.; Read, A.; Sykes, J.; Walton, D.; Branduardi-Raymont, G.; Kennedy, T.; Raab, W.; Verhoeve, P.; Agnolon, D. and Woffinden, C. (2018). The SMILE Soft X-ray Imager (SXI) CCD design and development. Journal of Instrumentation, 13(1), article no. C01022.

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