Currently browsing: Items authored or edited by Steven Parsons Orcid Logohttps://orcid.org/0000-0002-6128-1825

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Generated on Thu Nov 30 17:29:59 2023 GMT.

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Buggey, Thomas; Bush, Nathan; Soman, Matthew; Hall, David; Parsons, Steven and Holland, Andrew (2022). Short-term trap decay in a cryogenically irradiated charge-coupled device. In: European Conference on Radiation and Its Effect on Components and Systems (RADECs 2022, Venice), IEEE.

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Parsons, Steven; Hall, David; Holland, Andrew; Verhoeve, Peter; Sembay, Steven; Randall, George; Hetherington, Oliver; Yeoman, Dean; Buggey, Thomas and Soman, Matthew (2020). Radiation damage testing status of the CCDs for the SMILE SXI. In: X-Ray, Optical, and Infrared Detectors for Astronomy IX (Holland, Andrew and Beletic, James eds.), SPIE.

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Sembay, S.; Alme, A.L.; Agnolon, D.; Arnold, T.; Beardmore, A.; Belén Balado Margeli, A.; Bicknell, C.; Bouldin, C.; Branduardi-Raymont, G.; Breuer, J.P.; Buggey, T.; Butcher, G.; Canchal, R.; Carter, J.A.; Crawford, T.; Cheney, A.; Collado-Vega, Y.; Connor, H.; Crawford, T.; Eaton, N.; Feldman, C.; Forsyth, C.; Frantzen, T.; Galgóczi, G.; Garcia, J.; Genov, G.Y.; Gordillo, C.; Gröbelbauer, H-P.; Guedel, M.; Guo, Y.; Hailey, M.; Hall, D.; Hampson, R.; Hasiba, J.; Hetherington, O.; Holland, A.; Hsieh, S-Y; Hubbard, M.; Jeszenszky, H.; Jones, M.; Kennedy, T.; Koch-Mehrin, K.; Kögl, S.; Krucker, S.; Kuntz, K.D.; Lakin1, C.; Laky, G.; Lylund, O.; Martindale, A.; Miguel Mas Hesse, J.; Nakamura, R.; Oksavik, K.; Østgaard, N.; Ottacher, H.; Ottensamer, R.; Pagani, C.; Parsons, S.; Patel, P.; Pearson, J.; Peikert, G.; Porter, F.S.; Pouliantis, T.; Randall, G.; Qureshi, B.H; Raab, W.; Randall, G.; Read, A.M.; Roque, N.M.M.; Rostad, M.E.; Runciman, C.; Sachdev, S.; Samsonov, A.; Soman, M.; Sibeck, D.; Smit, S.; Søndergaard, J.; Speight, R.; Stavland, S.; Steller, M.; Sun, TianRan; Thornhill, J.; Thomas, W.; Ullaland, K.; Walsh, B.; Walton, D.; Wang, C. and Yang, S. (2023). The Soft X-ray Imager (SXI) on the SMILE Mission. Earth and Planetary Physics, 8(1) pp. 1–10.

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