Currently browsing: Items authored or edited by Peter E. J. Turner

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Crews, C.; Soman, M. R.; Lofthouse-Smith, D. D.; Allanwood, E. A. H.; Stefanov, K. D.; Leese, M.; Turner, P. and Holland, A. (2019). Predicting the effect of radiation damage on dark current in a space-qualified high performance CMOS image sensor. In: Journal of Instrumentation, IOP Publishing Ltd and Sissa Medialab, 14(11) C11008-C11008.

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