Currently browsing: Items authored or edited by Benjamin Dryer https://orcid.org/0000-0001-7925-9768

25 items in this list.
Generated on Fri Dec 9 00:15:20 2022 GMT.

Jump to:

2022 | 2020 | 2019 | 2018 | 2017 | 2016 | 2015 | 2014 | 2013 | 2012 | 2011 | 2010

2022To Top

Ahmed, Saad; Hall, David; Crowley, Cian; Skottfelt, Jesper; Dryer, Benjamin; Seabroke, George; Hernandez, Jose and Holland, Andrew (2022). Understanding the evolution of radiation damage on the Gaia CCDs after 72 months at L2. Journal of Astronomical Telescopes, Instruments, and Systems, 8(1), article no. 016003.

Kelman, Bradley; Prod'homme, Thibaut; Skottfelt, Jesper; Lemmel, Frederic; Arko, Matej; Liebing, Patricia; Verhoeve, Peter; Dryer, Benjamin; Hall, David and Hubbard, Michael (2022). Calibrating and correcting charge transfer inefficiency in CCDs using Pyxel. In: Proc. SPIE 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X, 12191F.

2020To Top

Ahmed, Saad; Hall, David; Crowley, Cian; Skottfelt, Jesper; Dryer, Benjamin; Seabroke, George; Hernandez, Jose and Holland, Andrew (2020). Gaia CCDs: charge transfer inefficiency measurements between five years of flight. In: X-Ray, Optical, and Infrared Detectors for Astronomy IX, SPIE, Bellingham, WA, 11454, article no. 114540S.

2019To Top

Russell, Sara; Smith, Caroline; Hutzler, Aurore; Meneghin, Andrea; Berthoud, Lucy; Aleon, Jerome; Bennett, Allan; Bridges, John; Brucato, John Robert; Debaille, Vinciane; Dryer, Ben; Ferriere, Ludovic; Folco, Luigi; Foucher, Frederic; Franchi, Ian; Gemelli, Maurizio; Gounelle, Matthieu; Grady, Monica; Guest, Mike; Holt, John; Leuko, Stefan; Longobardo, Andrea; Marrocchi, Yves; Palomba, Ernesto; Pottage, Thomas; Rettberg, Petra; Rotundi, Alessandra; Vrublevskis, John; Westall, Frances and Zipfel, Jutta (2019). EURO-CARES - A European Sample Curation Facility for Sample Return Missions. In: 2019 IEEE Aerospace Conference, IEEE, pp. 1–9.

Lindley-Decaire, Anton; Hall, D.; Bush, N.; Dryer, B. and Holland, A. (2019). The silicon lattice defects in proton and gamma irradiated n-channel CCDs. In: Proc. SPIE 11115, UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts IX, SPIE.

2018To Top

Skottfelt, Jesper; Hall, David J.; Dryer, Benjamin; Burgon, Ross and Holland, Andrew D. (2018). C3TM: CEI CCD charge transfer model for radiation damage analysis and testing. In: High Energy, Optical, and Infrared Detectors for Astronomy VIII, Proceedings, Society of Photo-Optical Instrumentation Engineers, article no. 1070918 (2018).

2017To Top

2016To Top

Dryer, B.; Smith, P.; Nuns, T.; Murray, N.; Stefanov, K. D.; Gow, J. P. D.; Burgon, R.; Hall, D. J. and Holland, A. D. (2016). Validation of NIEL for >1MeV electrons in silicon using the CCD47-20. In: High Energy, Optical, and Infrared Detectors for Astronomy VII, Proceedings of SPIE, SPIE, Bellingham, WA, article no. 9915-99.

2015To Top

Stefanov, Konstantin D.; Dryer, Ben. J.; Hall, David J.; Holland, Andrew D.; Pratlong, Jérôme; Fryer, Martin and Pike, Andrew (2015). A global shutter CMOS image sensor for hyperspectral imaging. In: Proceedings of SPIE, Society of Photo-Optical Instrumentation Engineers (SPIE), 9602, article no. 96020K.

2014To Top

2013To Top

2012To Top

Dryer, B. J.; Holland, A. D.; Jerram, P. and Sakao, Taro (2012). X-ray performance of e2v’s 0.18 μm CMOS APS test arrays for solar observation. In: High Energy, Optical, and Infrared Detectors for Astronomy V, 1-6 Jul 2012, Amsterdam.

2011To Top

Harriss, R. D.; Holland, A. D.; Barber, S. J.; Karout, S.; Burgon, R.; Dryer, B. J.; Murray, N. J.; Hall, D. J.; Smith, P. H.; Greig, T.; Tutt, J. H.; Endicott, J.; Jerram, P.; Morris, D.; Robbins, M.; Prevost, V. and Holland, K. (2011). Compact CMOS camera demonstrator (C3D) for Ukube-1. In: UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts V, 8 Sep 2011, San Diego.

2010To Top

Dryer, Ben; Holland, Andrew; Murray, N. J.; Jerram, Paul; Robbins, Mark and Burt, David (2010). Gamma radiation damage study of 0.18 µm process CMOS image sensors. Proceedings - SPIE the International Society for Optical Engineering, 7742(77420E)

Export

Subscribe to these results

get details to embed this page in another page Embed as feed [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0