Atomic spectrometry update. X-ray fluorescence spectrometry

West, Margaret; Ellis, Andrew T.; Kregsamer, Peter; Potts, Philip; Streli, Christina; Vanhoof, Christine and Wobrauschek, Peter (2007). Atomic spectrometry update. X-ray fluorescence spectrometry. Journal of Analytical Atomic Spectrometry, 22 pp. 1304–1322.



This annual review of X-ray fluorescence covers developments over the period 2006–2007 in instrumentation and detectors, matrix correction and spectrum analysis procedures, X-ray optics and micro-fluorescence, synchrotron XRF, TXRF, portable XRF and on-line applications as assessed from the published literature. The review also covers a survey of applications, including sample preparation, geological, environmental, archaeological, forensic, biological, clinical, thin films, chemical state and speciation studies. Interest continues in micro-analytical instrumentation with synchrotron-based systems benefiting from the availability of more intense beams and efficient focusing optics. Many authors have strengthened the influence of their work with data presented as elemental maps and, where appropriate, factor analysis continues to feature. In common with other analytical techniques, this review demonstrates the emerging field of metallomics to assist in the understanding of how metals and metalloids interact within cells and tissues. Progress continues to support legislation with further analytical methods and reference materials available for environmental and industrial applications. Improvements in detector resolution and excitation optics have helped to strengthen interest in EDXRF systems to meet the demands from society for a reduction in pollutants in ambient air. The writing team would welcome feedback from readers of this review and invite you to complete the Atomic Spectroscopy Updates questionnaire on

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