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Jones, L.S.; Crews, C.; Ivory, J. and Holland, A.
(2024).
DOI: https://doi.org/10.1088/1748-0221/19/05/p05017
Abstract
Evaluation of detectors for a soft X-ray imaging spectrometer has resulted in the need to understand the effect of charge spreading on apparent detector noise properties, and therefore achievable energy resolution. This paper presents a mathematical model for the processes leading to increased uncertainty within a simplified X-ray reconstruction process. This is a description for additional uncertainty introduced by the process of collecting X-ray generated electrons into a region of noisy pixels and reconstructing the recorded pixels values back into an estimated X-ray energy value. The predictions of the model, and preliminary experimental verification are shown.