Short-term trap decay in a cryogenically irradiated charge-coupled device

Buggey, Thomas; Bush, Nathan; Soman, Matthew; Hall, David; Parsons, Steven and Holland, Andrew (2022). Short-term trap decay in a cryogenically irradiated charge-coupled device. In: European Conference on Radiation and Its Effect on Components and Systems (RADECs 2022, Venice), IEEE.

Abstract

A CCD was irradiated cryogenically, and the trap pumping technique was used to monitor the evolution of the radiation induced traps. An unexpected trap was found which decays with a time constant of 3-4 hours.

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About

• Item ORO ID
• 91959
• Item Type
• Conference or Workshop Item
• Keywords
• CCD; cryogenic irradiation; trap pumping; defects
• Academic Unit or School
• Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
  Faculty of Science, Technology, Engineering and Mathematics (STEM)
• Research Group
• Centre for Electronic Imaging (CEI)
• Depositing User
• Thomas Buggey