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Buggey, Thomas; Bush, Nathan; Soman, Matthew; Hall, David; Parsons, Steven and Holland, Andrew
(2022).
Abstract
A CCD was irradiated cryogenically, and the trap pumping technique was used to monitor the evolution of the radiation induced traps. An unexpected trap was found which decays with a time constant of 3-4 hours.
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- Item ORO ID
- 91959
- Item Type
- Conference or Workshop Item
- Keywords
- CCD; cryogenic irradiation; trap pumping; defects
- Academic Unit or School
-
Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM) - Research Group
- Centre for Electronic Imaging (CEI)
- Depositing User
- Thomas Buggey