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Parsons, S.; Hall, D. J.; Hetherington, O.; Buggey, T. W.; Arnold, T.; Hubbard, M. W. J. and Holland, A.
(2023).
DOI: https://doi.org/10.26464/epp2023057
Abstract
Throughout the SMILE mission the satellite will be bombarded by radiation which gradually damages the focal plane devices and degrades their performance. In order to understand the changes of the CCD370s within the soft X-ray Imager, an initial characterisation of the devices has been carried out to give a baseline performance level. Three CCDs have been characterised, the two flight devices and the flight spare. This has been carried out at the Open University in a bespoke cleanroom measurement facility. The results show that there is a cluster of bright pixels in the flight spare which increases in size with temperature. However at the nominal operating temperature (−120 °C) it is within the procurement specifications. Overall, the devices meet the specifications when operating at −120 °C in 6 × 6 binned frame transfer science mode. The serial charge transfer inefficiency degrades with temperature in full frame mode. However any charge losses are recovered when binning/frame transfer is implemented.