Atomic spectrometry update. X-ray fluorescence spectrometry

Potts, P.; Ellis, A.T.; Kregsamer, P.; Marshall, J.; Steli, C.; West, M. and Wobrauschek, P. (2003). Atomic spectrometry update. X-ray fluorescence spectrometry. Journal of Analytical Atomic Spectrometry, 18(10) pp. 1297–1316.

DOI: https://doi.org/10.1039/b309420k

Abstract

This annual review of X-ray fluorescence covers developments over the period 2002-2003 in instrumentation and detectors, matrix correction and spectrum analysis procedures, X-ray optics and microfluorescence, synchrotron XRF, TXRF, portable XRF and on-line applications as assessed from the published literature. The review also covers a survey of applications, including sample preparation, geological, environmental, archaeological, forensic, biological, clinical, thin films, chemical state and speciation studies. During the current review period, trends were noted in the increased use of principal component analysis in the assessment of environmental data and chemometrics in the interpretation of XRF data in general, meticulous experimentation to model the emission spectra of X-ray tubes to improve the accuracy of FP correction procedures, a slowdown in reports on the development of ultra-high resolution cryogenic ED detectors, the use of EXAFS and XANES in fluorescence, as opposed to the more traditional absorption mode, continued interest in SR sources and interesting artefact measurements performed using XRF and related instrumentation.

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