Atomic spectrometry update. X-Ray fluorescence spectrometry

Potts, P.; Ellis, A.T.; Kregsamer, P.; Steli, C.; Vanhoof, C.; West, M. and Wobrauschek, P. (2005). Atomic spectrometry update. X-Ray fluorescence spectrometry. Journal of Analytical Atomic Spectrometry, 20(10) pp. 1124–1154.

DOI: https://doi.org/10.1039/b511542f

Abstract

This annual review of X-ray fluorescence covers developments over the period 2004 - 2005 in instrumentation and detectors, matrix correction and spectrum analysis procedures, X-ray optics and microfluorescence, synchrotron XRF, TXRF, portable XRF and on-line applications, as assessed from the published literature. The review also covers a survey of applications, including sample preparation, geological, environmental, archaeological, forensic, biological, clinical, thin films, chemical state and speciation studies. As was remarked on in last year's review, substantial numbers of papers continue to be offered in the areas of environmental, industrial and biological/clinical applications, indicating the continued importance of XRF in these fields. Furthermore, several papers have risen to the challenge presented by EU directives in the recycling of waste ( not the least plastic and related materials), landfill issues with the literature in general reflecting the growing contribution that XRF can make to these studies. There has, furthermore, been a continued growth in the application of portable XRF techniques, including, remarkably, both portable synchrotron and portable TXRF instrumentation. Interest continues in the development of silicon wafer based devices, including the silicon drift detectors, CCDs and other nanostructural arrays. These developments demonstrate the current prominence and potential for further growth of XRF in the modern analytical sciences.

Viewing alternatives

Metrics

Item Actions

Export

You can export this page using these formats Digital Object Identifier - DOI