Depth sensitive sampling of implanted species in Genesis Collectors using UV laser ablation and SIMS

Franchi, I.A.; Suhaimi, N.; Chater, R.J.; McPhail, D.S.; van Calsteren, P. and Butterworth, A.L. (2004). Depth sensitive sampling of implanted species in Genesis Collectors using UV laser ablation and SIMS. In: 35th Lunar and Planetary Science Conference, 15-19 Mar 2004, Houston, Texas, USA.

URL: http://www.lpi.usra.edu/meetings/lpsc2004/pdf/1681...

Abstract

SIMS profiling of laser abalation pits in CVD diamond implanted with oxygen- 18 shows that homogenised 193nm excimer laser beam can successfully ablate a layer a few nm thick, removing surface contamination without signicant loss of implanted sample.

Viewing alternatives

Look up in Google Scholar

Download history

Item Actions

Export

About

CORE (COnnecting REpositories)