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Loupas, Alexandra; Lozano, Ana. I.; Blanco, Francisco; Gorfinkiel, Jimena D. and García, Gustavo
(2018).
DOI: https://doi.org/10.1063/1.5040352
Abstract
We present cross sections for elastic and inelastic electron scattering from thiophene calculated in the energy range 0.1-1000 eV. The R-matrix and independent atom representation-screening-corrected additivity rule (IAM-SCAR) methods were used for low-energy and intermediate and high scattering energies, respectively. The results provide a consistent picture of the scattering process in the whole energy range. The effect of including an interference term in the IAM-SCAR approach is considered. Agreement with prior theoretical results is also discussed.
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