2015 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry and their applications

West, Margaret; Ellis, Andrew T.; Potts, Philip J.; Streli, Christina; Vanhoof, Christine and Wobrauschek, Peter (2015). 2015 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry and their applications. Journal of Analytical Atomic Spectrometry, 30(9) pp. 1839–1889.

DOI: https://doi.org/10.1039/c5ja90033f


This review describes advances in the X-ray fluorescence (XRF) group of techniques published approximately between April 2014 and March 2015 and is therefore restricted to a selection of papers featuring developments in the XRF armoury. An active topic during this review period was that of imaging techniques and, more particularly of micro XRF spectrometry. Silicon-based semiconductor X-ray detectors such as SDD and Si(PIN) continue to reflect the maturity and widespread routine use of such devices. The significant expansion in studies evaluating the field use of portable XRF instrumentation in geological applications, often still proving the quality of the data, rather than adopting the technique in routine applications. New synchrotron beamlines offer previously unavailable spatial resolution and throughput for the characterisation of advanced energy materials and devices under varying temperatures and gas atmospheres. Nanomaterials feature extensively this year such as the use of nanoparticles in cancer imaging and therapy. Synchrotron radiation has become a preferred technique for the analysis of a wide range of archeological samples, artwork, museum specimens and environmental studies. There has been a substantial rise in the number of Chinese researchers investigating objects of cultural heritage, especially porcelain, glazes and glass. Advances in TXRF and related techniques continue to feature with studies on thin films and nanomaterials. Feedback on this review is most welcome and the review coordinator can be contacted using the email address provided.

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