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Naik, Jay P.; Cheneler, David; Bowen, James and Prewett, Philip D.
(2017).
DOI: https://doi.org/10.1063/1.4989612
Abstract
A combination of Focused Ion Beam (FIB) and Reactive Ion Etch (RIE) was used to fabricate free standing gold nanowire bridges with radii of 30 nm and below. These were subjected to point loading to failure at their mid-points using an Atomic Force Microscope (AFM), providing strength and deformation data. The results demonstrate a dimensionally dependent transition from conventional solid metallic properties to liquid-like behaviour including the unexpected reformation of a fractured bridge. The work reveals mechanical and materials properties of nanowires which could have significant impact on nanofabrication processes and nanotechnology devices such as Nano Electro Mechanical Systems (NEMS).