Low energy electron attachment to formic acid

Pelc, A.; Sailer, W.; Scheier, P.; Mason, N.J. and Märk, T.D. (2002). Low energy electron attachment to formic acid. European Physical Journal D - Atomic, Molecular and Optical Physics, 20(3) pp. 441–444.

DOI: https://doi.org/10.1140/epjd/e2002-00140-1

Abstract

Using a high resolution electron energy monochromator low energy electron attachment to formic acid is studied for the first time by means of mass spectrometric detection of the product anions. The largest dissociative electron attachment (DA) cross-section produces HCOO-+H with weaker channels for OH- and O- becoming apparent at higher incident energies.

Viewing alternatives

Metrics

Item Actions

Export

You can export this page using these formats Digital Object Identifier - DOI