Electron attachment to simple organic acids

Pelc, A.; Sailer, W.; Scheier, P.; Mason, N.J.; Illenberger, E. and Märk, T.D. (2003). Electron attachment to simple organic acids. Vacuum, 70(2-3) pp. 429–433.

DOI: https://doi.org/10.1016/S0042-207X(02)00682-6

Abstract

Low energy (from 0 up to 13 eV) electron attachment to formic and acetic acid is studied for the first time by means of mass spectrometric detection of the product anions. The energy spread of electron beam was 120 meV (acetic acid) and 140 meV in the case of formic acid. For all negative fragments estimates for the absolute partial cross sections were obtained. In the case of both acids, the (parent—H)− ion yield shows a structure that is tentatively ascribed to the vibrational excitation in the formate anion.

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