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Murray, N. J.; Allanwood, E. A. H.; Dryer, B. J.; Weatherill, D. P.; Stefanov, K. D.; Holland, A. D. and Burt, D. J.
(2015).
URL: http://iopscience.iop.org/article/10.1088/1748-022...
Abstract
This paper presents a brief review of charge-redistrbution effects in charge-couple devices observed in both flat-field and spot data. Experiments are described that allow such phenomenon to be measured simply in the parallel transfer direction using only equipment capable of providing flat-field illuminations. A more detailed investigation into signal-dependant PSF shape distortions are descibed for both p- and n-channel CCDs of identical design. A number of methods to minimise the effect are presented that include different image electrode configurations and bias levels during integration and novel pixel architectures.
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- Item ORO ID
- 44266
- Item Type
- Journal Item
- ISSN
- 1748-0221
- Academic Unit or School
-
Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM) - Research Group
-
Centre for Electronic Imaging (CEI)
?? space ?? - Copyright Holders
- © 2015 IOP Publishing Ltd and Sissa Medialab srl
- Depositing User
- Neil Murray