Dissociation pathways in low energy (0–2 eV) electron attachment to Cl₂O

Sailer, Wolfgang; Tegeder, Petra; Probst, Michael; Drexel, Herwig; Grill, Verena; Scheier, Paul; Mason, Nigel J.; Illenberger, Eugen and Mark, Tilmann D. (2001). Dissociation pathways in low energy (0–2 eV) electron attachment to Cl₂O. Chemical Physics Letters, 344(5-6) pp. 471–478.

DOI: https://doi.org/10.1016/S0009-2614(01)00814-4

Abstract

Dissociative electron attachment (DA) to ClOCl is studied in a high resolution crossed beam experiment. Two complementary ion pairs, Cl⁻/ClO⁻ and O⁻/Cl₂⁻, are observed. The Cl⁻/ClO⁻ pair arises from a simple Cl–OCl bond cleavage with the electron sitting on either of the two fragments. The O⁻/Cl₂⁻ pair is formed by a concerted reaction with the expulsion of O⁻ (or O) and formation of Cl₂ (or Cl₂⁻). Ab initio calculations indicate that in low energy electron attachment an electronically excited state of the precursor anion (ClOCl⁻* (²B₂)) is involved.

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