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Gow, J. P. D.; Smith, P. H.; Pool, P.; Hall, D. J.; Holland, A. D. and Murray, N. J.
(2015).
DOI: https://doi.org/10.1088/1748-0221/10/01/C01037
Abstract
A number of studies have demonstrated that a room temperature proton irradiation may not be sufficient to provide an accurate estimation of the impact of the space radiation environment on detector performance. This is a result of the relationship between defect mobility and temperature, causing the performance to vary subject to the temperature history of the device from the point at which it was irradiated. Results measured using Charge Coupled Devices (CCD) irradiated at room temperature therefore tend to differ from those taken when the device was irradiated at a cryogenic temperature, more appropriate considering the operating conditions in space, impacting the prediction of in-flight performance. This paper describes the cryogenic irradiation, and subsequent annealing of an e2v technologies Swept Charge Device (SCD) CCD236 irradiated at −35.4°C with a 10 MeV equivalent proton fluence of 5.0 × 108 protons centerdot cm−2. The CCD236 is a large area (4.4 cm2) X-ray detector that will be flown on-board the Chandrayaan-2 and Hard X-ray Modulation Telescope spacecraft, in the Chandrayaan-2 Large Area Soft X-ray Spectrometer and the Soft X-ray Detector respectively. The SCD is readout continually in order to benefit from intrinsic dither mode clocking, leading to suppression of the surface component of the dark current and allowing the detector to be operated at warmer temperatures than a conventional CCD. The SCD is therefore an excellent choice to test and demonstrate the variation in the impact of irradiation at cryogenic temperatures in comparison to a more typical room temperature irradiation.
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About
- Item ORO ID
- 43518
- Item Type
- Journal Item
- ISSN
- 1748-0221
- Project Funding Details
-
Funded Project Name Project ID Funding Body Funding the development of the cryogenic irradiation test kit. Not Set ESA - Extra Information
- Part of 10th International Conference on Position Sensitive Detectors
- Keywords
- proton damage; CCD; SCD; low temperature irradiation
- Academic Unit or School
-
Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM) - Research Group
-
Centre for Electronic Imaging (CEI)
?? space ?? - Copyright Holders
- © 2015 IOP Publishing Ltd and Sissa Medialab srl
- Depositing User
- Jason Gow