Optimisation of nanoscale surface topography analysis

Bowen, James and Cheneler, David (2012). Optimisation of nanoscale surface topography analysis. In: RSC Postgraduate Symposium on Nanotechnology, 14 Dec 2012, Birmingham, UK.

URL: https://www.academia.edu/9846046/Optimisation_of_n...

Abstract

The objective of this research was to answer the question “Does there exist an optimal range of analysis conditions for the measurement of nanoscale surface roughness?” Characterisation of the surface topography of a selection of polished, machined, deposited and cast materials over a range of length scales was performed using atomic force microscopy. The average roughness, Ra, was calculated for each image.

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