Development of EM-CCD-based X-ray detector for synchrotron applications

Tutt, J. H.; Hall, D. J.; Soman, M. R.; Holland, A. D.; Warren, A.; Connolley, T. and Evagora, A. M. (2014). Development of EM-CCD-based X-ray detector for synchrotron applications. Electronics Letters, 50(17) pp. 1224–1226.



A high speed, low noise camera system for crystallography and X-ray imaging applications is developed and successfully demonstrated. By coupling an electron-multiplying (EM)-CCD to a 3:1 fibre-optic taper and a CsI(Tl) scintillator, it was possible to detect hard X-rays. This novel approach to hard X-ray imaging takes advantage of sub-electron equivalent readout noise performance at high pixel readout frequencies of EM-CCD detectors with the increase in the imaging area that is offered through the use of a fibre-optic taper. Compared with the industry state of the art, based on CCD camera systems, a high frame rate for a full-frame readout (50 ms) and a lower readout noise (<1 electron root mean square) across a range of X-ray energies (6–18 keV) were achieved.

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