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Mironov, O. A.; Hassan, A. H. A.; Morris, R. J. H.; Dobbie, A.; Uhlarz, M.; Chrastina, D.; Hague, J. P.; Kiatgamolchai, S.; Beanland, R.; Gabani, S.; Berkutov, I. B.; Helm, M.; Drachenko, O.; Myronov, M. and Leadley, D. R.
(2014).
DOI: https://doi.org/10.1016/j.tsf.2013.10.118
Abstract
Hole mobilities at low and room temperature (RT) have been studied for a strained sGe/SiGe heterostructure using standard Van der Pauw resistivity and Hall effect measurements. The range of magnetic field and temperatures used were − 14 T < B < + 14 T and 1.5 K < T < 300 K respectively. Using maximum entropy-mobility spectrum analysis (ME-MSA) and Bryan's algorithm mobility spectrum (BAMS) analysis, a RT two dimensional hole gas drift mobility of (3.9 ± 0.4) × 103 cm2/V s was determined for a sheet density (ps) 9.8 × 1010 cm-2 (by ME-MSA) and (3.9 ± 0.2) × 103 cm2/V s for a sheet density (ps) 5.9 × 1010 cm-2 (by BAMS).