Proton damage comparison of an e2v technologies n-channel and p-channel CCD204

Gow, Jason; Murray, Neil; Holland, Andrew and Burt, David (2014). Proton damage comparison of an e2v technologies n-channel and p-channel CCD204. IEEE Transactions on Nuclear Science, 61(4) pp. 1843–1848.

DOI: https://doi.org/10.1109/TNS.2014.2298254

Abstract

Comparisons have been made of the relative degradation of charge transfer efficiency in n-channel and p-channel CCDs subjected to proton irradiation. The comparison described in this paper was made using e2v technologies plc. CCD204 devices fabricated using the same mask set. The device performance was compared over a range of temperatures using the same experimental arrangement and technique to provide a like-for-like comparison. The parallel transfer using the p-channel CCD was then optimized using a trap pumping technique to identify the optimal operating conditions at 153 K.

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