Resonant soft X-ray emission and X-ray absorption studies on Ga1-xMnxN grown by pulsed laser deposition

Krishnamurthy, Satheesh; Kennedy, Brian; Mcgee, Fintan; Venkatesan, M.; Coey, J. M. D.; Lunney, James G.; Learmonth, Timothy; Smith, Kevin E.; Schmitt, Thorsten and McGuinness, Cormac (2011). Resonant soft X-ray emission and X-ray absorption studies on Ga1-xMnxN grown by pulsed laser deposition. Physica Status Solidi (C) Current Topics in Solid State Physics, 8(5) pp. 1608–1610.




In this study thin film samples of Ga1-xMnxN were grown by pulsed laser deposition on A12O3 (0001) substrates. X-ray diffraction measurements have confirmed these thin films exhibit hexagonal wurtzite structure. SQUID measurements show room temperature ferromagnetism of these dilute magnetic semiconductors (DMS). The techniques of X-ray absorption and soft X-ray emission spectroscopy at the N K-edge were used to study the changes in the unoccupied and occupied N 2p partial density of states respectively as a function of dopant concentration. These element and site specific spectroscopies allow us to characterise the electronic structure of these doped materials and reveal the influence of the Mn doping on the valence band as measured through the N 2p partial density of states. X-ray absorption measurements at the Mn L-edge confirm significant substitutional doping of Mn into Ga-sites. Finally, measurements of heavily Mn-doped films using both soft X-ray absorption and resonant soft X-ray emission at the N K edge reveal the presence of trapped molecular nitrogen. The trapped molecular nitrogen may be due to the high instantaneous deposition rate in the PLD process for these samples.

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  • Item ORO ID
  • 35405
  • Item Type
  • Journal Item
  • ISSN
  • 1610-1642
  • Keywords
  • dilute magnetic nitrides; dilute magnetic semiconductors; dopant concentrations; doped materials; hexagonal wurtzite structure; Mn-doped; Mn-doping; molecular nitrogen; NEXAFS; partial density of state; PLD process; room temperature ferromagnetism; site-specific spectroscopy; soft X ray emission spectroscopy; soft x-ray emissions; soft-X-ray absorption; SQUID measurements; X-ray diffraction measurements; X-ray emission absorption; electromagnetic wave emission; electronic structure; Emission spectroscopy; ferromagnetism; ion beams; magnetic semiconductors; manganese; nitrides; nitrogen; pulsed laser deposition; pulsed lasers; semiconductor doping; semiconductor lasers; thin films; vapor deposition; X ray absorption; X ray diffraction; X ray scattering; X rays; zinc sulfide; absorption spectroscopy
  • Academic Unit or School
  • Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
    Faculty of Science, Technology, Engineering and Mathematics (STEM)
  • Copyright Holders
  • © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
  • Depositing User
  • Satheesh Krishnamurthy