Characterisation of swept-charge devices for the Chandrayaan-1 x-ray spectrometer (C1XS) instrument

Gow, J.; Smith, D. R.; Holland, A. D.; Maddison, B.; Howe, C.; Sreekumar, P.; Huovelind, J. and Grande, M. (2007). Characterisation of swept-charge devices for the Chandrayaan-1 x-ray spectrometer (C1XS) instrument. In: SPIE Optics+Photonics 2007: Astronomical Optics and Instrumentation, 26-30 Aug 2007, San Diego, California, USA.

DOI: https://doi.org/10.1117/12.734062

URL: http://spie.org/x16063.xml

Abstract

The Indian Space Research Organisation (ISRO) Chandrayaan-1 mission is India’s first lunar spacecraft, containing a suite of instruments to carry out high-resolution remote sensing of the Moon at visible, near infrared and X-ray wavelengths. Due for launch in early 2008, the spacecraft will carry out its two year mission in a polar orbit around the Moon at an altitude of 100 km. One of the eleven instruments in the spacecraft payload is the Chandrayaan-1 X-ray Spectrometer (C1XS), a descendant of the successful D-CIXS instrument that flew on the European Space Agency SMART-1 lunar mission launched in 2003. C1XS consists of 24 swept-charge device (SCD) silicon X-ray detectors arranged in 6 modules that will carry out high quality X-ray spectroscopic mapping of the Moon using the technique of X-ray fluorescence. This paper presents an overview of the Chandrayaan-1 mission and specifically the C1XS instrument and describes the development of an SCD test facility, proton irradiation characterisation and screening of candidate SCD devices for the mission.

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