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Vopson, Melvin M.; Weaver, Paul M.; Cain, Markys G.; Reece, Mike J. and Chong, K. B.
(2011).
DOI: https://doi.org/10.1109/ISAF.2010.5712238
URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arn...
Abstract
Time and thermal dependent effects are critical for the operation of non-volatile memories based on ferroelectrics. In this paper we assume a domain nucleation process of the polarization reversal and we discuss the polarization dynamics in the framework of a non-equilibrium statistical approach. This approach yields analytical expressions, which can be used to explain a wide range of time and thermal dependent effects in ferroelectrics. Experimental P-E loops data obtained for soft ferroelectrics at various temperatures are well predicted by the theory.