Low energy electron attachment to condensed formic acid

Ptasinska, S.; Bass, A. D. and Sanche, L. (2008). Low energy electron attachment to condensed formic acid. Journal of Physics: Conference Series, 115(1) 012018.

DOI: https://doi.org/10.1088/1742-6596/115/1/012018

Abstract

Dissociative electron attachment to formic acid in the condensed phase is studied using improved mass spectrometric detection of the negative ion fragments. The desorbed yields are measured as a function of incident electron energy in the range between 3 to 20 eV. Unlike previous work, the formation of the dehydrogenated anion HCOO? is observed and the signal to noise ratio is much higher for all other ions detected, i.e. OH?, O? and H?. Resonant structure seen in all anion yield functions, is attributed to dissociative electron attachment (DEA), whereas above 14 eV nonresonant dipolar dissociation (DD) dominates the desorption yields.

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