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Waugh, A.R.; Payne, S.; Worrall, G.M. and Smith, G.D.W.
(1984).
DOI: https://doi.org/10.1051/jphyscol:1984934
Abstract
A controlled ion milling procedure is described which permits a feature of interest, such as a grain boundary to be brought towards the imaging region at the apex of a field ion specimen.