Ba_0.5Sr_0.5TiO₃–Bi_1.5Zn_1.0Nb1.5O₇ composite thin films with promising microwave dielectric properties for microwave device applications

Yan, L.; Kong, L. B.; Chen, L. F.; Chong, K. B.; Tan, C. Y. and Ong, C. K. (2004). Ba_0.5Sr_0.5TiO₃–Bi_1.5Zn_1.0Nb1.5O₇ composite thin films with promising microwave dielectric properties for microwave device applications. Applied Physics Letters, 85(16) pp. 3522–3524.

DOI: https://doi.org/10.1063/1.1785861

Abstract

Crack-free, dense, and uniform Ba_0.5Sr_0.5TiO₃(BST)–Bi_1.5Zn_1.0Nb_1.5O₇(BZN) composite thin films were deposited on (100) LaAlO₃, (100) SrTiO₃, and (100) MgO substrates via a pulsed laser deposition, using a combined target of BST and BZN ceramics. Phase composition and microstructure of the BST-BZN thin films were characterized by x-ray diffraction and scanning electron microscopy. The films, on LAO, STO, and MgO substrates, showed zero-field microwave (-7.7 GHz) dielectric constants of 471, 435, and 401, dielectric loss tangents of 0.0048, 0.0043, and 0.0037, and dielectric tunabilities of 6.2%, 6.0%, and 5.7% at -8.1 kV∕cm, respectively. The good physical and electrical properties of the BST–BZN composite thin films make them promising candidates for microwave device applications.

Viewing alternatives

Metrics

Item Actions

Export

You can export this page using these formats Digital Object Identifier - DOI

About

• Item ORO ID
• 23063
• Item Type
• Journal Item
• ISSN
• 1077-3118
• Academic Unit or School
• Faculty of Science, Technology, Engineering and Mathematics (STEM)
• Copyright Holders
• © 2004 American Institute of Physics
• Depositing User
• Kok Boon Chong