High-resolution strain mapping in bulk samples using full-profile analysis of energy-dispersive synchrotron X-ray diffraction data

Steuwer, A.; Santisteban, J. R.; Turski, M.; Withers, P. J. and Buslaps, T. (2004). High-resolution strain mapping in bulk samples using full-profile analysis of energy-dispersive synchrotron X-ray diffraction data. Journal of Applied Crystallography, 37(6) pp. 883–889.

DOI: https://doi.org/10.1107/S0021889804023349

Abstract

The feasibility of both high spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beamline ID15A at the ESRF. The data analysis was performed using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point uncertainty of 10-5. The measurements have been validated with complementary techniques or reference data.

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