Copy the page URI to the clipboard
Cicman, P.; Buchanan, G. A.; Marston, G.; Gulejová, B.; Skalný, J. D.; Mason, N. J.; Scheier, P. and Märk, T. D.
(2004).
DOI: https://doi.org/10.1063/1.1806822
Abstract
Electron attachment was studied in gaseous dinitrogen pentoxide, N2O5, for incident electron energies between a few meV and 10 eV. No stable parent anion N2O was observed but several anionic fragments (NO, NO, NO–, O–, and O) were detected using quadrupole mass spectrometry. Many of these dissociative pathways were found to be coupled and provide detailed information on the dynamics of N2O5 fragmentation. Estimates of the cross sections for production of each of the anionic fragments were made and suggest that electron attachment to N2O5 is amongst the most efficient attachment reactions recorded for nonhalogenated polyatomic systems.