X-ray induced damage in DNA monitored by X-ray photoelectron spectroscopy

Ptasińska, Sylwia; Stypczyńska, Agnieszka; Nixon, Tony; Mason, Nigel J.; Klyachko, Dimitri V. and Sanche, Léon (2008). X-ray induced damage in DNA monitored by X-ray photoelectron spectroscopy. Journal of Chemical Physics, 129(6) pp. 129–134.

DOI: https://doi.org/10.1063/1.2961027

Abstract

In this work, the chemical changes in calf thymus DNA samples were analyzed by X-ray photoelectron spectroscopy XPS. The DNA samples were irradiated for over 5 h and spectra were taken repeatedly every 30 min. In this approach the X-ray beam both damages and probes the samples. In most cases, XPS spectra have complex shapes due to contributions of C, N, and O atoms bonded at several different sites. We show that from a comparative analysis of the modification in XPS line shapes of the C 1s, O 1s, N 1s, and P 2p peaks, one can gain insight into a number of reaction pathways leading to radiation damage to DNA.

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