Determination of residual stresses by X-ray diffraction

Fitzpatrick, M. E.; Fry, A. T.; Holdway, P.; Kandil, F. A.; Shackleton, J. and Suominen, L (2005). Determination of residual stresses by X-ray diffraction. National Physical Laboratory, Teddington, UK.



This guide is applicable to X-ray stress measurements on crystalline materials. There is currently no published standard for the measurement of residual stress by XRD. This guide has been developed therefore as a source of information and advice on the technique. It is based on results from two UK intercomparison exercises, detailed parameter investigations and discussions and input from XRD experts. The information is presented in separate sections which discuss the fundamental background of X-ray diffraction techniques, the different types of equipment that can be used, practical issues relating to the specimen, the measurement procedure itself and recommendation on how and what to record and report. The appendices provide further information on uncertainty evaluation and some recommendations regarding the data analysis techniques that are available. Where appropriate key points are highlighted in the text and summarised at the end of the document.

Viewing alternatives

No digital document available to download for this item

Item Actions