Currently browsing: Items authored or edited by William Plumbridge

30 items in this list.
Generated on Wed Aug 12 19:56:51 2020 BST.

Jump to:

2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1998 | 1996 | 1995

2009To Top

Plumbridge, W. J. (2009). New avenues for failure analysis. Engineering Failure Analysis, 16(5) pp. 1347–1354.

Plumbridge, W. J. (2009). Fatigue resistance and structure (30 years on). Fatigue and Fracture of Engineering Materials and Structures, 32(6) pp. 461–463.

2008To Top

Plumbridge, W. J. (2008). Recent Observations on Tin Pest Formation in Solder Alloys. Journal of Electronic Materials, 37(2) pp. 218–223.

2007To Top

Liu, X. W. and Plumbridge, W. J. (2007). Damage Produced in Solder Alloys during Thermal Cycling. Journal of Electronic Materials, 36(9) pp. 1111–1120.

Plumbridge, W.J. (2007). Tin pest issues in lead-free electronic solders. Journal of Materials Science: Materials in Electronics, 18(1-3) pp. 307–318.

Plumbridge, W.J. (2007). Tin pest in electronics? Circuit World, 33(1) pp. 9–14.

Plumbridge, W. J. (2007). Defects in electronics and their significance for structural integrity. Fatigue and Fracture of Engineering Materials and Structures, 30(5) pp. 432–442.

2006To Top

Rist, Martin A.; Plumbridge, W.J. and Cooper, S. (2006). Creep-constitutive behavior of Sn-3.8Ag-0.7Cu solder using an internal stress approach. Journal of Electronic Materials, 35(5) pp. 1050–1058.

Plumbridge, W.J. (2006). Implementing lead-free solders - the performance aspects. Soldering and Surface Mount Technology, 18(1) pp. 11–18.

2005To Top

Plumbridge, William J. (2005). Second generation lead-free solder alloys: a challenge to thermodynamics. Monatshefte fur Chemie / Chemical Monthly, 136(11) pp. 1811–1821.

2004To Top

Plumbridge, W.J. and Kariya, Y. (2004). Structural integrity in electronics. Fatigue and Fracture of Engineering Materials and Structures, 27(8) pp. 723–734.

Shohji, Ikuo; Gagg, Colin and Plumbridge, William J. (2004). Creep properties of Sn-8Mass%Zn-3Mass%Bi lead-free alloy. Journal of Electronic Materials, 33(8) pp. 923–927.

Plumbridge, W.J. (2004). Long term mechanical reliability with lead-free solders. Soldering and Surface Mount Technology, 16(2) pp. 13–20.

2003To Top

Liu, X.W. and Plumbridge, W.J. (2003). Thermomechanical fatigue of Sn–37 wt.% Pb model solder joints. Materials Science and Engineering A, 362(1-2) pp. 309–321.

Liu, X.W. and Plumbridge, W.J. (2003). Damage produced in model solder (Sn-37Pb) joints during thermomechanical cycling. Journal of Electronic Materials, 32(4) pp. 278–286.

Plumbridge, W.J. (2003). The analysis of creep data for solder alloys. Soldering and Surface Mount Technology, 15(1) pp. 26–30.

Plumbridge, William (2003). Mechanical evaluation in electronics. In: Suganama, K. ed. Lead-free soldering in electronics: Science, technology and environmental impact. New York: Marcel Dekker, pp. 183–218.

2002To Top

Plumbridge, W. J. and Gagg, C. R. (2002). The influence of temperature on the creep of tin-37 lead solders. In: TMS Fall Meeting, 6-10 Oct 2002, Columbus Ohio, USA.

2001To Top

Plumbridge, W. J.; Gagg, C. R. and Peters, S. (2001). The creep of lead-free solders at elevated temperatures. Journal of Electronic Materials, 30(9) pp. 1178–1183.

Kariya, Yoshiharu; Williams, Naomi; Gagg, Colin and Plumbridge, William (2001). Tin pest in Sn-0.5 wt.% Cu lead-free solder. JOM Journal of the Minerals, Metals and Materials Society, 53(6) pp. 39–41.

Kariya, Yoshiharu; Gagg, Colin and Plumbridge, William J. (2001). Tin pest in lead-free solders. Soldering and Surface Mount Technology, 13(1) pp. 39–40.

Plumbridge, W.; Kariya, Y. and Gagg, C. R. (2001). The influence of processing history on the creep of tin-3.5 silver alloys. In: Seventh Symposium on Microjoining and Assembly Technology in Electronics (MATE 2001), 2001, Yokohama, Japan.

2000To Top

Kariya, Y.; Gagg, C. R.; Williams, N. and Plumbridge, W. J. (2000). Allotropic transformation study and phase mapping in tin-copper lead-free solder for electronic assembly. In: CHANNEL Users Meeting, 15-18 Jun 2000, Hobro, Denmark.

Plumbridge, W. J. and Gagg, C. R. (2000). The mechanical properties of lead-containing and lead-free solders—meeting the environmental challenge. Proceedings of the Institution of Mechanical Engineers Part L, Journal of Materials: Design and Applications, 214(3) pp. 153–161.

1999To Top

Plumbridge, W. J. and Gagg, C. R. (1999). Effects of strain rate and temperature on the stress–strain response of solder alloys. Journal of Materials Science: Materials in Electronics, 10(5-6) pp. 461–468.

1998To Top

Plumbridge, W. J.; Gagg, C. R. and Moffatt, J. (1998). Solders for the Next Millennium. In: Materials Congress; Institute of Materials, 6-8 Apr 1998, Cirencester, Wilts.

1996To Top

Gagg, Colin and Plumbridge, William (1996). The effect of ageing on the creep of a eutectic lead-tin alloy. In: British Association for Brazing and Soldering (BABS) Autumn Conference, 30-31 Oct 1996, Birmingham.

1995To Top

Hermann, R.; Moffatt, J. and Plumbridge, W. J. (1995). A comparison of crack initiation techniques for ceramics. Journal of Materials Science Letters, 14(4) pp. 282–284.

Export

Subscribe to these results

get details to embed this page in another page Embed as feed [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0