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Parsons, Steven; Hall, David; Holland, Andrew; Verhoeve, Peter; Sembay, Steven; Randall, George; Hetherington, Oliver; Yeoman, Dean; Buggey, Thomas and Soman, Matthew (2020). Radiation damage testing status of the CCDs for the SMILE SXI. In: X-Ray, Optical, and Infrared Detectors for Astronomy IX (Holland, Andrew and Beletic, James eds.), SPIE.

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