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Generated on Wed Sep 23 15:01:57 2020 BST.

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Sebastiani, Marco; Rossi, Edoardo; Mughal, Muhammad Zeeshan; Benedetto, Alessandro; Jacquet, Paul; Salvati, Enrico and Korsunsky, Alexander M. (2020). Nano-Scale Residual Stress Profiling in Thin Multilayer Films with Non-Equibiaxial Stress State. Nanomaterials, 10(5), article no. 853.

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