Currently browsing: Items authored or edited by Julian Heymes https://orcid.org/0000-0002-0922-2529

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Heymes, J.; Dorokhov, A.; Kachel, M. and Baudot, J. (2019). Study of the depletion depth in a frontside biased CMOS pixel sensors. Journal of Instrumentation, 14(1), article no. P01018.

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