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Items Authored or Edited by Anthony Evagora

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Jump to: 2018 | 2017 | 2014 | 2013 | 2012
Number of items: 7.

2018

Pitcher, C.; Sheridan, S.; Barber, S.; Urbina, D.; Gancet, J.; Kullack, K.; Ceglia, E.; Madakashira, H.; Salinia, J.; Govindaraj, S.; Surdo, L.; Aked, R.; Biswas, J.; Reiss, P.; Richter, L.; Dobrea, D.; Reganaz, M.; Murray, Neil; Rushton, J. and Evagora, A. (2018). Volatile Extraction and Detection from Frozen Lunar Regolith Simulants in Preparation for the LUVMI Rover. In: 6th European Lunar Symposium, 14-16 May 2018, Toulouse, France. file

2017

Urbina, Diego; Gancet, Jeremi; Kullack, Karsten; Ceglia, Enrico; Madakashira, Hemanth; Salini, Joseph; Govindaraj, Shashank; Surdo, Leonardo; Aked, Richard; Sheridan, Simon; Pitcher, Craig; Barber, Simeon; Biswas, Janos; Philipp, Reiss; Rushton, Joseph; Murray, Neil; Evagora, Anthony; Richter, Lutz; Dobrea, Diana and Reganaz, Mattia (2017). LUVMI: an innovative payload for the sampling of volatiles at the Lunar poles. In: 68th International Astronautical Congress, 25-29 Sep 2017, Adelaide, Australia. file

2014

Tutt, J. H.; Hall, D. J.; Soman, M. R.; Holland, A. D.; Warren, A.; Connolley, T. and Evagora, A. M. (2014). Development of EM-CCD-based X-ray detector for synchrotron applications. Electronics Letters, 50(17) pp. 1224–1226. file

Tutt, J. H.; Hall, D. J.; Soman, M. R.; Holland, A. D.; Warren, A. J.; Connolley, T. and Evagora, A. M. (2014). Comparison of EM-CCD and scientific CMOS based camera systems for high resolution X-ray imaging and tomography applications. Journal of Instrumentation, 9(6), article no. P06017.

2013

Evagora, Anthony Minas (2013). Factors Affecting EMCCD Technology for Use in Space. PhD thesis The Open University. file

2012

Tutt, James H.; Holland, Andrew D.; Murray, Neil J.; Hall, David J.; Harriss, Richard D.; Clarke, Andrew and Evagora, Anthony M. (2012). The noise performance of electron-multiplying charge-coupled devices at soft X-ray energy values. IEEE Transactions on Electron Devices, 59(8) pp. 2192–2198. file

Evagora, A. M.; Murray, N. J.; Holland, A. D.; Burt, D. and Endicott, J. (2012). Novel method for identifying the cause of inherent ageing in Electron Multiplying Charge Coupled Devices. Journal of Instrumentation, 7(1) C01023.

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