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Items Authored or Edited by Andrew Clarke

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Number of items: 14.

2018

Stefanov, Konstantin D.; Clarke, Andrew S.; Ivory, James and Holland, Andrew D. (2018). Design and Performance of a Pinned Photodiode CMOS Image Sensor Using Reverse Substrate Bias. Sensors, 18(1), article no. 118.

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2017

Stefanov, Konstantin; Clarke, Andrew; Ivory, James and Holland, Andrew (2017). Characterisation of a novel reverse-biased PPD CMOS image sensor. Journal of Instrumentation, 12(11), article no. C11009.

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Stefanov, Konstantin D.; Clarke, Andrew S.; Ivory, James and Holland, Andrew D. (2017). Fully Depleted, Monolithic Pinned Photodiode CMOS Image Sensor Using Reverse Substrate Bias. In: International Image Sensor Workshop, May 30 – 2 June, 2017, Hiroshima, Japan, pp. 109–112.

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Stefanov, Konstantin D.; Clarke, Andrew S. and Holland, Andrew D. (2017). Fully Depleted Pinned Photodiode CMOS Image Sensor With Reverse Substrate Bias. IEEE Electron Device Letters, 38(1) pp. 64–66.

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2016

Stefanov, Konstantin D.; Clarke, Andrew S. and Holland, Andrew D. (2016). Fully depleted and backside biased monolithic CMOS image sensor. In: High Energy, Optical, and Infrared Detectors for Astronomy VII (Holland, Andrew D. and Beletic, James eds.), p. 991513.

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2015

Clarke, A.; Stefanov, K.; Johnston, N. and Holland, A. (2015). Fully depleted, thick, monolithic CMOS pixels with high quantum efficiency. Journal of Instrumentation, 10(4), article no. T04005.

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2014

Hall, David J.; Murray, Neil J.; Holland, Andrew D.; Gow, Jason; Clarke, Andrew and Burt, David (2014). Determination of in situ trap properties in CCDs using a "single-trap pumping" technique. IEEE Transactions on Nuclear Science, 61(4) pp. 1826–1833.

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2013

Clarke, A.; Hall, D.; Murray, N.; Gow, J.; Holland, A. and Burt, D. (2013). Pixel-level modelling and verification for the EUCLID VIS CCD. In: UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts VI, SPIE, article no. 8860 0V.

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Greig, Thomas; Stefanov, Konstantin; Holland, Andrew; Clarke, Andrew; Burt, David and Gow, Jason (2013). Total ionizing dose effects on I-V and noise characteristics of MOS transistors in a 0.18 μm CMOS Image Sensor process. In: 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

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2012

Clarke, A.; Hall, D.; Murray, N.; Holland, A. and Burt, D. (2012). Device modelling and model verification for the Euclid CCD273 detector. In: High Energy, Optical, and Infrared Detectors for Astronomy V, 1-6th July 2012, Amsterdam.

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Tutt, James H.; Holland, Andrew D.; Murray, Neil J.; Hall, David J.; Harriss, Richard D.; Clarke, Andrew and Evagora, Anthony M. (2012). The noise performance of electron-multiplying charge-coupled devices at soft X-ray energy values. IEEE Transactions on Electron Devices, 59(8) pp. 2192–2198.

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Clarke, A. S.; Hall, D. J.; Holland, A. and Burt, D. (2012). Modelling charge storage in Euclid CCD structures. Journal of Instrumentation, 7(C0105)

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Gow, J. P. D.; Murray, N. J.; Hall, D. J.; Clarke, A. S.; Burt, D.; Endicott, J. and Holland, A. D. (2012). Assessment of proton radiation-induced charge transfer inefficiency in the CCD273 detector for the Euclid Dark Energy Mission. In: High Energy, Optical, and Infrared Detectors for Astronomy V, 1-6 July 2012, Amsterdam.

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Hall, David J.; Holland, Andrew; Murray, Neil; Gow, Jason and Clarke, Andrew (2012). Modelling charge transfer in a radiation damaged charge coupled device for Euclid. In: High Energy, Optical, and Infrared Detectors for Astronomy V, 01-06 July 2012, Amsterdam.

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