The Open UniversitySkip to content
 

Browse by Journal

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0 [Create Shortened URL] SURL
Embed as feed
Group by: Published Date | Item Type | No Grouping
Jump to: 2012
Number of items: 3.

2012

Hall, David; Gow, Jason; Murray, Neil and Holland, Andrew (2012). Optimisation of device clocking schemes to minimise the effects of radiation damage in charge coupled devices. IEEE Transactions on Electron Devices, 59(4) pp. 1099–1106.

Tutt, James H.; Holland, Andrew D.; Hall, David J.; Harriss, Richard D. and Murray, Neil J. (2012). The Noise Performance of Electron-Multiplying Charge-Coupled Devices at X-ray Energies. IEEE Transactions on Electron Devices, 59(1) pp. 167–175.

Tutt, James H.; Holland, Andrew D.; Murray, Neil J.; Hall, David J.; Harriss, Richard D.; Clarke, Andrew and Evagora, Anthony M. (2012). The noise performance of electron-multiplying charge-coupled devices at soft X-ray energy values. IEEE Transactions on Electron Devices, 59(8) pp. 2192–2198.

This list was generated on Fri May 24 21:55:51 2013 BST.

Policies | Disclaimer

© The Open University   + 44 (0)870 333 4340   general-enquiries@open.ac.uk