The Open UniversitySkip to content
 

Atomic spectrometry update. X-Ray fluorescence spectrometry

Potts, P.; Ellis, A.T.; Kregsamer, P.; Steli, C.; Vanhoof, C.; West, M. and Wobrauschek, P. (2005). Atomic spectrometry update. X-Ray fluorescence spectrometry. Journal of Analytical Atomic Spectrometry, 20(10) pp. 1124–1154.

DOI (Digital Object Identifier) Link: http://dx.doi.org/10.1039/b511542f
Google Scholar: Look up in Google Scholar

Abstract

This annual review of X-ray fluorescence covers developments over the period 2004 - 2005 in instrumentation and detectors, matrix correction and spectrum analysis procedures, X-ray optics and microfluorescence, synchrotron XRF, TXRF, portable XRF and on-line applications, as assessed from the published literature. The review also covers a survey of applications, including sample preparation, geological, environmental, archaeological, forensic, biological, clinical, thin films, chemical state and speciation studies. As was remarked on in last year's review, substantial numbers of papers continue to be offered in the areas of environmental, industrial and biological/clinical applications, indicating the continued importance of XRF in these fields. Furthermore, several papers have risen to the challenge presented by EU directives in the recycling of waste ( not the least plastic and related materials), landfill issues with the literature in general reflecting the growing contribution that XRF can make to these studies. There has, furthermore, been a continued growth in the application of portable XRF techniques, including, remarkably, both portable synchrotron and portable TXRF instrumentation. Interest continues in the development of silicon wafer based devices, including the silicon drift detectors, CCDs and other nanostructural arrays. These developments demonstrate the current prominence and potential for further growth of XRF in the modern analytical sciences.

Item Type: Journal Article
ISSN: 0267-9477
Keywords: Silicon drift detectors; dust storm event; dar-es-salaam; proportional-scintillation-counter; influence coefficient algorithms; individual cloud droplets; portable xrf spectrometer; micro-raman spectroscopy; brazilian cerrado soils; ion mass-spectrometry
Academic Unit/Department: Science > Environment, Earth and Ecosystems
Interdisciplinary Research Centre: Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)
Item ID: 8886
Depositing User: Astrid Peterkin
Date Deposited: 09 Aug 2007
Last Modified: 02 Dec 2010 20:03
URI: http://oro.open.ac.uk/id/eprint/8886
Share this page:

Actions (login may be required)

View Item
Report issue / request change

Policies | Disclaimer

© The Open University   + 44 (0)870 333 4340   general-enquiries@open.ac.uk