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Atomic spectrometry update - X-ray fluorescence spectrometry

Potts, P.; Ellis, A.T.; Kregsamer, P.; Steli, C.; Vanhoof, C.; West, M. and Wobrauscheck, P. (2006). Atomic spectrometry update - X-ray fluorescence spectrometry. Journal of Analytical Atomic Spectrometry, 21(10) pp. 1076–1107.

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This annual review of X-ray fluorescence covers developments over the period 2005-2006 in instrumentation and detectors, matrix correction and spectrum analysis procedures, X-ray optics and microfluorescence, synchrotron XRF, TXRF, portable XRF and on-line applications, as assessed from the published literature. The review also covers a survey of applications, including sample preparation, geological, environmental, archaeological, forensic, biological, clinical, thin films, chemical state and speciation studies. The trend set in previous years continues with large numbers of papers published in the areas of environmental, industrial and biological/clinical applications, followed this year by a significant contribution in the area of archaeological science and cultural heritage. Notable contributions this year are in areas of topical societal interest, including the rapid throughput screening for combatorial materials. Interest continues in nanotechnological applications as well as the related micro-analytical instrumentation that permits pro. ling and mapping of samples, which was previously undertaken by non-XRF techniques.

Item Type: Journal Item
ISSN: 0267-9477
Keywords: Manganese oxide-films; detector performance characterization; scanning-electron-microscopy; absorption fine-structure; silicon drift detectors; trace-element analysis; rare-earth-elements; synchrotron-radiation; thin-films; in-situ
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Environment, Earth and Ecosystem Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Item ID: 8881
Depositing User: Astrid Peterkin
Date Deposited: 09 Aug 2007
Last Modified: 02 May 2018 12:47
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