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Depth sensitive sampling of implanted species in Genesis Collectors using UV laser ablation and SIMS

Franchi, I.A.; Suhaimi, N.; Chater, R.J.; McPhail, D.S.; van Calsteren, P. and Butterworth, A.L. (2004). Depth sensitive sampling of implanted species in Genesis Collectors using UV laser ablation and SIMS. In: 35th Lunar and Planetary Science Conference, 15-19 March 2004, Houston, Texas, USA.

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Abstract

SIMS profiling of laser abalation pits in CVD diamond implanted with oxygen- 18 shows that homogenised 193nm excimer laser beam can successfully ablate a layer a few nm thick, removing surface contamination without signicant loss of implanted sample.

Item Type: Conference Item
Extra Information: Abstract #1681
Academic Unit/Department: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Interdisciplinary Research Centre: Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)
Item ID: 8602
Depositing User: Kyra Proctor
Date Deposited: 17 Jul 2007
Last Modified: 04 Aug 2016 02:03
URI: http://oro.open.ac.uk/id/eprint/8602
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