Franchi, I.A.; Suhaimi, N.; Chater, R.J.; McPhail, D.S.; van Calsteren, P. and Butterworth, A.L.
Depth sensitive sampling of implanted species in Genesis Collectors using UV laser ablation and SIMS.
In: 35th Lunar and Planetary Science Conference, 15-19 March 2004, Houston, Texas, USA.
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SIMS profiling of laser abalation pits in CVD diamond implanted with oxygen- 18 shows that homogenised 193nm excimer laser beam can successfully ablate a layer a few nm thick, removing surface contamination without signicant loss of implanted sample.
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