Extraction and analysis of microcrater residues using focused ion beam microscopy

Bridges, J.C.; Franchi, I.A. and Green, S.F. (2006). Extraction and analysis of microcrater residues using focused ion beam microscopy. In: 37th Lunar and Planetary Science Conference, 13-17 March 2006, Houston, Texas, USA.

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Abstract

We describe results from a new technique using dual beam FIB/SEM with which impact residues can be extracted from microcraters and analysed by EDS. This will allow the determination of residue compositions from Stardust craters.

Item Type:	Conference Item
Extra Information:	Abstract #1664
Academic Unit/Department:	Science > Physical Sciences
Interdisciplinary Research Centre:	Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)
Item ID:	8464
Depositing User:	Kyra Proctor
Date Deposited:	16 Jul 2007
Last Modified:	04 Dec 2010 20:55
URI:	http://oro.open.ac.uk/id/eprint/8464

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