Bridges, J.C.; Franchi, I.A. and Green, S.F.
Extraction and analysis of microcrater residues using focused ion beam microscopy.
In: 37th Lunar and Planetary Science Conference, 13-17 March 2006, Houston, Texas, USA.
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We describe results from a new technique using dual beam FIB/SEM with which impact residues can be extracted from microcraters and analysed by EDS. This will allow the determination of residue compositions from Stardust craters.
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