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Extraction and analysis of microcrater residues using focused ion beam microscopy

Bridges, J.C.; Franchi, I.A. and Green, S.F. (2006). Extraction and analysis of microcrater residues using focused ion beam microscopy. In: 37th Lunar and Planetary Science Conference, 13-17 March 2006, Houston, Texas, USA.

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We describe results from a new technique using dual beam FIB/SEM with which impact residues can be extracted from microcraters and analysed by EDS. This will allow the determination of residue compositions from Stardust craters.

Item Type: Conference Item
Extra Information: Abstract #1664
Academic Unit/Department: Science > Physical Sciences
Interdisciplinary Research Centre: Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)
Item ID: 8464
Depositing User: Kyra Proctor
Date Deposited: 16 Jul 2007
Last Modified: 23 Feb 2016 21:34
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