Extraction and analysis of microcrater residues using focused ion beam microscopy

Bridges, J.C.; Franchi, I.A. and Green, S.F. (2006). Extraction and analysis of microcrater residues using focused ion beam microscopy. In: 37th Lunar and Planetary Science Conference, 13-17 Mar 2006, Houston, Texas, USA.

URL: http://www.lpi.usra.edu/meetings/lpsc2006/pdf/1664...

Abstract

We describe results from a new technique using dual beam FIB/SEM with which impact residues can be extracted from microcraters and analysed by EDS. This will allow the determination of residue compositions from Stardust craters.

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