Bras, W.; Dolbnya, I.P.; Detollenaere, D.; van Tol, R.; Malfois, M.; Greaves, G.N.; Ryan, A.J. and Heeley, E.
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|DOI (Digital Object Identifier) Link:||http://doi.org/10.1107/S002188980300400X|
|Google Scholar:||Look up in Google Scholar|
Recent results using a new combined small-angle/wide-angle X-ray scattering (SAXS/WAXS) beam line at the European Synchrotron Radiation Source (ESRF) will be presented. This beam line is specifically designed to be able to handle complicated sample environments required to perform time-resolved experiments mimicking processing conditions used in material science. Besides the attention that has been given to the interfacing of these sample environments to the beam line data acquisition system also the developments in detector technology will be discussed. The influence that a high count rate and low noise WAXS detector can have on the accuracy of experimental results in polymer crystallisation will be shown. It is shown that it is feasible to detect crystalline volume fractions as low as 10(-3)-10(-4) in polymeric systems.
|Item Type:||Journal Article|
|Keywords:||SAXS/WAXS; polymers; glass; crystallinity|
|Academic Unit/Department:||Science > Life, Health and Chemical Sciences
|Depositing User:||Astrid Peterkin|
|Date Deposited:||22 Dec 2006|
|Last Modified:||24 Feb 2016 00:41|
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