Agazzi,, L.; Bennett, S.; Berry, F.J.; Carbucicchio, M.; Rateo, M.; Ruggiero, G. and Turilli, G.
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|DOI (Digital Object Identifier) Link:||http://doi.org/10.1063/1.1499203|
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Co/Fe multilayers with different layer thickness formed by electron beam evaporation in ultrahigh vacuum have been investigated by grazing incidence x-ray reflectivity (GIXRR) and alternating gradient force magnetometry. The interface thicknesses are lower than GIXRR uncertainty (similar to1 nm), favoring a strong magnetic exchange interaction between the layers responsible for their single phase magnetic behavior. The hysteresis loops were interpreted as the result of two different magnetization processes related to the presence of an out-of-plane component of the magnetization.
|Item Type:||Journal Article|
|Copyright Holders:||2002 American Institute of Physics|
|Extra Information:||This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.|
|Keywords:||electron beams; hysteresis loop; interfaces; reflectance|
|Academic Unit/Department:||Faculty of Science, Technology, Engineering and Mathematics (STEM) > Life, Health and Chemical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
|Depositing User:||David Shuker|
|Date Deposited:||09 Nov 2006|
|Last Modified:||03 Aug 2016 17:39|
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