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C3TM: CEI CCD charge transfer model for radiation damage analysis and testing

Skottfelt, Jesper; Hall, David J.; Dryer, Benjamin; Burgon, Ross and Holland, Andrew D. (2018). C3TM: CEI CCD charge transfer model for radiation damage analysis and testing. In: High Energy, Optical, and Infrared Detectors for Astronomy VIII, Proceedings, Society of Photo-Optical Instrumentation Engineers, article no. 1070918 (2018).

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Radiation induced defects in the silicon lattice of Charge Couple Devices (CCDs) are able to trap electrons during read out and thus create a smearing effect that is detrimental to the scientific data. To further our understanding of the positions and properties of individual radiation-induced traps and how they affect space- borne CCD performance, we have created the Centre for Electronic Imaging (CEI) CCD Charge Transfer Model (C3TM). This model simulates the physical processes taking place when transferring signal through a radiation damaged CCD. C3TM is a Monte Carlo model based on Shockley-Read-Hall theory, and it mimics the physical properties in the CCD as closely as possible. It runs on a sub-electrode level taking device specific charge density simulations made with professional TCAD software as direct input. Each trap can be specified with 3D positional information, emission time constant and other physical properties. The model is therefore also able to simulate multi-level clocking and other complex clocking schemes, such as trap pumping.

Item Type: Conference or Workshop Item
Copyright Holders: 2018 Society of Photo-Optical Instrumentation Engineers (SPIE)
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
Item ID: 56280
Depositing User: Jesper Skottfelt
Date Deposited: 10 Sep 2018 08:47
Last Modified: 04 May 2019 06:19
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