The Open UniversitySkip to content
 

Thermal annealing response following irradiation of a CMOS imager for the JUICE JANUS instrument

Lofthouse-Smith, D.-D.; Soman, M.R.; Allanwood, E.A.H.; Stefanov, K.D.; Holland, A.D.; Leese, M. and Turner, P. (2018). Thermal annealing response following irradiation of a CMOS imager for the JUICE JANUS instrument. Journal of Instrumentation, 13(3), article no. C03036.

Full text available as:
[img]
Preview
PDF (Accepted Manuscript) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader
Download (961kB) | Preview
DOI (Digital Object Identifier) Link: https://doi.org/10.1088/1748-0221/13/03/C03036
Google Scholar: Look up in Google Scholar

Abstract

ESA's JUICE (JUpiter ICy moon Explorer) spacecraft is an L-class mission destined for the Jovian system in 2030. Its primary goals are to investigate the conditions for planetary formation and the emergence of life, and how does the solar system work. The JANUS camera, an instrument on JUICE, uses a 4T back illuminated CMOS image sensor, the CIS115 designed by Teledyne e2v. JANUS imager test campaigns are studying the CIS115 following exposure to gammas, protons, electrons and heavy ions, simulating the harsh radiation environment present in the Jovian system. The degradation of 4T CMOS device performance following proton fluences is being studied, as well as the effectiveness of thermal annealing to reverse radiation damage. One key parameter for the JANUS mission is the Dark current of the CIS115, which has been shown to degrade in previous radiation campaigns. A thermal anneal of the CIS115 has been used to accelerate any annealing following the irradiation as well as to study the evolution of any performance characteristics. CIS115s have been irradiated to double the expected End of Life (EOL) levels for displacement damage radiation (2×1010 protons, 10 MeV equivalent). Following this, devices have undergone a thermal anneal cycle at 100°C for 168 hours to reveal the extent to which CIS115 recovers pre-irradiation performance. Dark current activation energy analysis following proton fluence gives information on trap species present in the device and how effective anneal is at removing these trap species. Thermal anneal shows no quantifiable change in the activation energy of the dark current following irradiation.

Item Type: Journal Item
Copyright Holders: 2018 IOP Publishing Ltd and Sissa Medialab
ISSN: 1748-0221
Extra Information: 11th International Conference on Position Sensitive Detectors
3–8 September 2017
The Open University, Walton Hall, Milton Keynes, U.K.
Keywords: Radiation damage to detector materials (solid state); Space instrumentation
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
Item ID: 55021
Depositing User: Daniel-Dee Lofthouse-Smith
Date Deposited: 09 May 2018 09:08
Last Modified: 02 May 2019 14:00
URI: http://oro.open.ac.uk/id/eprint/55021
Share this page:

Metrics

Altmetrics from Altmetric

Citations from Dimensions

Download history for this item

These details should be considered as only a guide to the number of downloads performed manually. Algorithmic methods have been applied in an attempt to remove automated downloads from the displayed statistics but no guarantee can be made as to the accuracy of the figures.

Actions (login may be required)

Policies | Disclaimer

© The Open University   contact the OU