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Importance of charge capture in interphase regions during readout of charge-coupled devices

Skottfelt, Jesper; Hall, David J.; Dryer, Ben; Bush, Nathan; Gow, Jason P. D. and Holland, Andrew D. (2018). Importance of charge capture in interphase regions during readout of charge-coupled devices. Journal of Astronomical Telescopes, Instruments, and Systems, 4(1), article no. 018005.

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DOI (Digital Object Identifier) Link: https://doi.org/10.1117/1.JATIS.4.1.018005
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Abstract

The current understanding of charge transfer dynamics in charge-coupled devices (CCDs) is that charge is moved so quickly from one phase to the next in a clocking sequence and with a density so low that trapping of charge in the interphase regions is negligible. However, simulation capabilities developed at the Centre for Electronic Imaging, which includes direct input of electron density simulations, have made it possible to investigate this assumption further. As part of the radiation testing campaign of the Euclid CCD273 devices, data have been obtained using the trap pumping method, a method that can be used to identify and characterize single defects within CCDs. Combining these data with simulations, we find that trapping during the transfer of charge among phases is indeed necessary to explain the results of the data analysis. This result could influence not only trap pumping theory and how trap pumping should be performed but also how a radiation-damaged CCD is readout in the most optimal way.

Item Type: Journal Item
Copyright Holders: 2018 SPIE
ISSN: 2329-4124
Keywords: charge-coupled devices; radiation; simulations; image reconstruction
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
Item ID: 54291
Depositing User: Jesper Skottfelt
Date Deposited: 13 Apr 2018 10:22
Last Modified: 04 May 2019 16:40
URI: http://oro.open.ac.uk/id/eprint/54291
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