Smith, A. D.; Schofield, P. F.; Scholl, A.; Pattrick, R.A.D. and Bridges, J.C.
|DOI (Digital Object Identifier) Link:||http://doi.org/10.1051/jp4:20030102|
|Google Scholar:||Look up in Google Scholar|
The crystal chemistry and textural relationships of minerals hold a vast amount of information relating to the formation, history and stability of natural materials. The application of soft X-ray spectroscopy to mineralogical material has revealed that 2p (L2,3 spectra provide a sensitive fingerprint of the electronic states of 3d metals. In bulk powdered samples much of the textural and microstructural information is lost, but the area-selectivity capability of X-ray Photo-Emission Electron Microscopy (XPEEM) provides the ability to obtain valence state information from mineral intergrowths with a submicron spatial resolution.
Using the state-of-the-art PEEM2 facility on beamline 220.127.116.11 at the Advanced Light Source, Berkeley, USA, a range of minerals, mineral intergrowths and mineralogical textures have been studied for a broad suite of geological, planetary and environmental science materials. High-quality, multi-element valence images have been obtained showing the distribution/variation of the metal valence states across single grains or mineral intergrowths/textures at the l00 nm scale and quantitative valence state ratios can be obtained from areas of ~0.01 .
|Item Type:||Journal Article|
|Extra Information:||Some of the symbols may not have transferred correctly into this bibliographic record.|
|Academic Unit/Department:||Science > Physical Sciences
|Interdisciplinary Research Centre:||Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)|
|Depositing User:||Users 6044 not found.|
|Date Deposited:||03 Aug 2006|
|Last Modified:||14 Jan 2016 16:12|
|Share this page:|